Structural, surface morphology and optical properties of sputter-coated CaCu 3 Ti 4 O 12 thin film: Influence of RF magnetron sputtering power-Reference-Cited by-同舟云学术

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Structural, surface morphology and optical properties of sputter-coated CaCu 3 Ti 4 O 12 thin film: Influence of RF magnetron sputtering power

Published:2017-08 Issue: Volume:66 Page:157-161
ISSN:1369-8001
Container-title:Materials Science in Semiconductor Processing
language:en
Short-container-title:Materials Science in Semiconductor Processing

Author:

Ahmadipour Mohsen,Ayub Siti Nursalma,Ain Mohd Fadzil,Ahmad Zainal Arifin

Funder

Universiti Sains Malaysia

FRGS

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference23 articles.

1. Applications of CCTO supercapacitor in energy storage and electronics

2. Structural Model of Planar Defects in CaCu3Ti4O12 Exhibiting a Giant Dielectric Constant

3. High Dielectric Constant in ACu3Ti4O12 and ACu3Ti3FeO12 Phases

4. Towards enhanced varistor property and lower dielectric loss of CaCu3Ti4O12 based ceramics

5. Sol–gel synthesized pure CaCu3Ti4O12 with very low dielectric loss and high dielectric constant

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1. The room temperature signature of micro to nanocrystalline calcium copper titanate (CCTO) thin film by a modified sol-gel technique and tailoring its material property;Surfaces and Interfaces;2024-10

2. Sputtering thin films: Materials, applications, challenges and future directions;Advances in Colloid and Interface Science;2024-08

3. A highly-sensitive wearable capacitance pressure sensor based on calcium copper titanate/polydimethysiloxane/graphene oxide and polydimethysiloxane/silver nanowires sanwich strustures combination for human body monitoring;Materials Chemistry and Physics;2024-06

4. Influence of different annealing ambient on terbium oxide passivation layers sputtered using the RF sputtering on silicon substrate;Nano Express;2024-06-01

5. Influence of power and duration on RF sputtering for the formation of terbium oxide passivation layers via the argon ambient;Journal of Materials Science: Materials in Electronics;2024-05

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