The surface morphology, structural properties and chemical composition of Cd 1−x Zn x Te polycrystalline thick films deposited by close spaced vacuum sublimation

Author:

Znamenshchykov Y.V.,Kosyak V.V.,Opanasyuk A.S.,Dauksta E.,Ponomarov A.A.,Romanenko A.V.,Stanislavov A.S.,Medvids A.,Shpetnyi I.O.,Gorobets Yu.I.

Funder

Erasmus Ianus Programme

Ministry of Education and Science of Ukraine

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference44 articles.

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2. Compound Semiconductor Radiation Detectors;Owens,2012

3. State of the art of (Cd,Zn)Te as gamma detector;Fiederle;J. Cryst. Growth,1999

4. Growth and properties of semi-insulating CdZnTe for radiation detector applications;Szeles;Proc. SPIE - Int. Soc. Opt. Eng.,1998

5. Growth of Cd1−xZnxTe crystals with different x values and their qualities comparison;Li;J. Cryst. Growth,2004

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