Evaluation and identification of potential high-value patents in the field of integrated circuits using a multidimensional patent indicators pre-screening strategy and machine learning approaches-Reference-Cited by-同舟云学术

Evaluation and identification of potential high-value patents in the field of integrated circuits using a multidimensional patent indicators pre-screening strategy and machine learning approaches

Published:2023-05 Issue:2 Volume:17 Page:101406
ISSN:1751-1577
Container-title:Journal of Informetrics
language:en
Short-container-title:Journal of Informetrics

Author:

Hu Zewen,Zhou Xiji,Lin Angela

Funder

National Office for Philosophy and Social Sciences

National Planning Office of Philosophy and Social Sciences

Publisher

Elsevier BV

Subject

Library and Information Sciences,Computer Science Applications

Reference61 articles.

1. Direct validation of citation counts as indicators of industrially important patents;Albert;Research Policy,1991

2. Validating patent indicators that assess technological radicalness: The case of biotechnology;Arts,2012

3. Statistic measurement of patent quality;Barney,2010

4. Quantitative determination of technological improvement from patent data;Benson;PloS One,2015

5. The value of U.S. patents by owner and patent characteristics[J];Bessen;Research Policy,2008

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Cosmetic patent and female invention;PLOS ONE;2024-08-08

2. A new hybrid machine learning model for predicting the renewal life of patents;PLOS ONE;2024-06-26

3. Research on High-Value Patent Identification Model from Perspective of Patent Transfer;2024-04-12

4. Configuration paths to high-value patents: evidence from patents winning the China Patent Awards;Scientometrics;2024-04-04

5. Research on patent quality evaluation based on rough set and cloud model;Expert Systems with Applications;2024-01