Optical film thickness measurement of turbid materials using the fractional BiSpectrum noise-reduction technique-Reference-Cited by-同舟云学术

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Optical film thickness measurement of turbid materials using the fractional BiSpectrum noise-reduction technique

Published:2019-06 Issue: Volume:440 Page:106-116
ISSN:0030-4018
Container-title:Optics Communications
language:en
Short-container-title:Optics Communications

Author:

Babaie Jonathan,Abolbashari Mehrdad,Farahi Navid,Kim Sun Myong,Farahi Faramarz

Funder

University of North Carolina at Charlotte, USA

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference31 articles.

1. The speckle effect;Hecht,2017

2. Optical properties of thin films;Heavens;Rep. Progr. Phys.,1960

3. Properties and characterization of thin films;Bergauer,2017

4. Optical properties of solid thin films by spectroscopic reflectometry and spectroscopic ellipsometry;Miller,2008

5. Ellipsometry;Pedersen,2004

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1. Accuracy-improved ultrasonic phase algorithm for measuring lubricant film thickness;International Journal of Mechanical Sciences;2024-04

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