Spurious electro-optic coefficients inferred from modulation ellipsometry measurements in the presence of an air cavity-Reference-Cited by-同舟云学术

Spurious electro-optic coefficients inferred from modulation ellipsometry measurements in the presence of an air cavity

Published:2017-04 Issue: Volume:389 Page:283-289
ISSN:0030-4018
Container-title:Optics Communications
language:en
Short-container-title:Optics Communications

Author:

Quilty J.W.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference41 articles.

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5. Reflection method for electro-optical coefficient determination in stratified thin film structures;Levy;Mol. Cryst. Liq. Cryst. Sci. Technol. Sect. B: Nonlinear Opt.,1993

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