Linear birefringence parameters determination of a multi-order wave plate via phase detection at large oblique incidence angles-Reference-Cited by-同舟云学术

Linear birefringence parameters determination of a multi-order wave plate via phase detection at large oblique incidence angles

Published:2008-06 Issue:11 Volume:281 Page:3036-3041
ISSN:0030-4018
Container-title:Optics Communications
language:en
Short-container-title:Optics Communications

Author:

Tsai Chien-Chung,Wei Hsiang-Chun,Hsieh Cheng-Hung,Wu Jheng-Syong,Lin Chu-En,Chou Chien

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference14 articles.

1. Method for determining the fast axis and phase retardation of a wave plate

2. Three-stage birefringent filter tuning smoothly over the visible region: theoretical treatment and experimental design

3. Stability of birefringent linear retarders (waveplates)

4. Transmitted and tuning characteristics of birefringent filters

5. Explicit Jones transformation matrix for a tilted birefringent plate with its optic axis parallel to the plate surface

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2. Study of the retardance of a birefringent waveplate at tilt incidence by Mueller matrix ellipsometer;Journal of Optics;2017-12-12

3. Birefringent phase demodulator: application to wave plate characterization;Applied Optics;2015-03-16

4. Novel achromatic single reflection quarter-wave retarder: Design and measurement;Review of Scientific Instruments;2014-03

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