Author:
Huang Lei,Sun Chuang,Lei Ming
Funder
National Natural Science Foundation of China
Subject
Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference21 articles.
1. Phase measuring deflectometry: a new approach to measure specular free-form surfaces;Knauer;Proc. SPIE,2004
2. Measuring large mirrors using SCOTS, the software configurable optical test system;Burge;Proc. SPIE,2014
3. Microdeflectometry—a novel tool to acquire three-dimensional microtopography with nanometer height resolution;Häusler;Opt. Lett.,2008
4. Full-field 3D shape measurement of discontinuous specular objects by direct phase measuring deflectometry;Liu;Sci. Rep.,2017
5. D. Sprenger, C. Faber, M.C. Seraphim, G. and Häusler, UV-Deflectometry: No parasitic reflections, in: Proc. DGaO, 2010.
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献