Single-shot phase measuring profilometry based on color binary grating with intervals-Reference-Cited by-同舟云学术

Single-shot phase measuring profilometry based on color binary grating with intervals

Published:2019-11 Issue: Volume:451 Page:268-275
ISSN:0030-4018
Container-title:Optics Communications
language:en
Short-container-title:Optics Communications

Author:

Wang Yapin,Cao Yiping,Fu Guangkai,Wang Lu,Wan Yingying,Li Chengmeng

Funder

863 National Plan Foundation of China

Special Grand National Project of China

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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