Author:
Ingerle D.,Pepponi G.,Meirer F.,Wobrauschek P.,Streli C.
Funder
Austrian Science Fund (FWF)
Subject
Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry
Reference38 articles.
1. Glancing-incidence x-ray fluorescence of layered materials;de Boer;Phys. Rev. B,1991
2. Glancing-incidence X-ray analysis;Van Den Hoogenhof;Spectrochim. Acta B At. Spectrosc.,1993
3. Glancing incidence X-ray analysis: forgotten or to be discovered?;van den Hoogenhof;Surf. Interface Anal.,1994
4. Characterisation of layered materials with glancing incidence X-ray analysis;Leenaers;Spectrosc. Eur.,1996
5. G. Pepponi, C. Streli, P. Wobrauschek, N. Zoeger, K. Luening, P. Pianetta, et al., Nondestructive dose determination and depth profiling of arsenic ultrashallow junctions with total reflection X-ray fluorescence analysis compared to dynamic secondary ion mass spectrometry, Spectrochim. Acta Part B At. Spectrosc. 59 (2004) 1243–1249, http://dx.doi.org/10.1016/j.sab.2004.04.014.
Cited by
28 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献