Determination of low atomic number elements at trace levels in uranium matrix using vacuum chamber total reflection X-ray fluorescence

Author:

Misra N.L.,Dhara Sangita,Óvári M.,Záray Gy.,Aggarwal S.K.,Varga Imre

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference14 articles.

1. Determination of impurities in uranium matrices by time-of-flight ICP-MS using matrix-matched method;Bürger;J. Radioanal. Nucl. Chem.,2007

2. Determination of trace impurities in uranium compounds by ICP-AES after organic extraction;Marin;Fresenius' J. Anal. Chem.,1996

3. Analytical chemistry of fast reactor fuels — a review;Ramaniah;Pure Appl. Chem.,1982

4. Determination of oxygen to metal ratio of U–Pu mixed oxides by X-ray diffraction;Verma;Bull. Mater. Sci.,1986

5. Trace element determination in thorium oxide using total reflection X-ray fluorescence spectrometry;Misra;Spectrochim. Acta Part B,2008

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