Focusing of soft X-ray radiation and characterization of the beam profile enabling X-ray emission spectrometry at nanolayered specimens-Reference-Cited by-同舟云学术

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Focusing of soft X-ray radiation and characterization of the beam profile enabling X-ray emission spectrometry at nanolayered specimens

Published:2012-12 Issue: Volume:78 Page:37-41
ISSN:0584-8547
Container-title:Spectrochimica Acta Part B: Atomic Spectroscopy
language:en
Short-container-title:Spectrochimica Acta Part B: Atomic Spectroscopy

Author:

Unterumsberger R.,Müller M.,Beckhoff B.,Hönicke P.,Pollakowski B.,Bjeoumikhova S.

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference18 articles.

1. Nickel LIII fluorescence and satellite transition probabilities determined with an alternative methodology for soft-X-ray emission spectrometry;Müller;Phys. Rev. A,2009

2. Capillary optics for micro X-ray fluorescence analysis;Bjeoumikhov;Rev. Sci. Instrum.,2005

3. A combination of synchrotron and laboratory X-ray techniques for studying tissue-specific trace level metal distributions in daphnia magna;De Samber;J. Anal. At. Spectrom.,2008

4. Protein crystal diffraction patterns using a capillary-focused synchrotron X-ray beam;Balaic;J. Synchrotron Radiat.,1996

5. Applications of polycapillary X-ray optics in protein crystallography;Li;J. Appl. Crystallogr.,1998

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