Determination of X-ray compression efficiency of a thin film X-ray waveguide structure using marker layer fluorescence
Author:
Publisher
Elsevier BV
Subject
Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry
Reference38 articles.
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5. Phase contrast hard X-ray microscopy with submicron resolution;Lagomarsino;Appl. Phys. Lett.,1997
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3. X-ray Spectrometry;Analytical Chemistry;2008-05-24
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