Holographic interferometry applied to the study of residual deformations induced by a pulsed ion implanter-Reference-Cited by-同舟云学术

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Holographic interferometry applied to the study of residual deformations induced by a pulsed ion implanter

Published:1995-01 Issue:2-3 Volume:70 Page:187-190
ISSN:0257-8972
Container-title:Surface and Coatings Technology
language:en
Short-container-title:Surface and Coatings Technology

Author:

Kaufmann G.H.,Brühl S.P.,Feugeas J.N.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference14 articles.

1. Materials Science Aspects of Ion Beam Technology

2. The Stopping and Range of Ions in Solids;Ziegler,1985

3. Surface Modification and Alloying by Laser, Electron and Ion Beam,1983

4. Materials Modification by Energetic Atoms and Ions;Feugeas,1992

5. Holographic Interferometry;Vest,1979

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Anomalous behaviour of the elasticity modulus in argon-irradiated pure copper;Journal of Materials Science Letters;1996

2. Generation of residual deformations by pulsed ion implantation;Journal of Physics D: Applied Physics;1995-08-14

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