Formation and annealing behavior of an amorphous layer induced by tin implantation into sapphire-Reference-Cited by-同舟云学术

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Formation and annealing behavior of an amorphous layer induced by tin implantation into sapphire

Published:1992-04 Issue:1-3 Volume:51 Page:415-419
ISSN:0257-8972
Container-title:Surface and Coatings Technology
language:en
Short-container-title:Surface and Coatings Technology

Author:

Romana L.J.,Sklad P.S.,White C.W.,McCallum J.C.,Choudhury A.,Horton L.L.,McHargue C.J.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference17 articles.

1. An investigation of ion implantation-induced near-surface stresses and their effects in sapphire and glass

2. S. M. M. Ramos, B. Canut, L. Gea, P. Thevenard, M. Bauer, Y. Maheo, P. Kapsa and J. L. Lobet, J. Mater. Res., in the press.

3. Phase formation study in α-Al2O3 implanted with niobium ions

4. DC current transport in iron-implanted MgO single crystals

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Surface Modification of Sapphire by Magnesium-Ion Implantation;Journal of the American Ceramic Society;2004-12-21

2. Investigations on the Formation of SiO2in Si+-Implanted Al2O3;Japanese Journal of Applied Physics;1993-10-01

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