Atomic force microscopy for thin film analysis-Reference-Cited by-同舟云学术

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Atomic force microscopy for thin film analysis

Published:1994-12 Issue: Volume:68-69 Page:770-775
ISSN:0257-8972
Container-title:Surface and Coatings Technology
language:en
Short-container-title:Surface and Coatings Technology

Author:

Phillips Roger W.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference4 articles.

1. Zero-order diffractive microstructures for security applications;Gale,1990

2. Optically variable films, pigments and inks;Phillips,1990

3. Pick the right probe for your SPM needs;Cassidy,1993

4. Evaporated dielectric colorless films on PET and OPP exhibiting high barriers toward moisture and oxygen;Phillips,1993

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Advances in Structural and Morphological Characterization of Thin Magnetic Films: A Review;Materials;2023-11-24

2. Effect of Sr-doped on physical and photoluminescence properties of SnO2 transparent conducting oxide thin films;Journal of Materials Science: Materials in Electronics;2023-04

3. A comparative study on Ga3+, Ti4+, and Bi5+-doped SnO2 transparent conducting oxide thin films deposited by the spin coating method;Journal of Materials Science: Materials in Electronics;2023-01

4. Structural, electrical, and optical properties of rare-earth Sm3+ doped SnO2 transparent conducting oxide thin films for optoelectronic device applications: Synthesized by the spin coating method;Optical Materials;2022-11

5. Atomic force microscopy characterization of polyethylene terephthalate grafting with poly(styrene sulfonate);Nanotechnology;2022-02-21

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