Author:
Baril Lydia,Wallash Albert,Guarisco Davide
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Biotechnology,Electronic, Optical and Magnetic Materials
Reference9 articles.
1. B. Perry, ESD damage threshold: history and prognosis. EOS/ESD Symposium 00, 2000, p. 318.
2. White noise magnetization fluctuations in magnetoresistive heads;Smith;Appl. Phys. Lett,2001
3. Tunable ferromagnetic resonance peak in tunneling magneto resistive sensor structures;Nazarov;Appl. Phys. Lett,2002
4. T. Hamaguchi, T. Ichihara, T. Ohtsu, Analysis of Barkhausen noise failure caused by ESD in a GMR head, EOS/ESD Symposium, 2002, p. 119.
5. Fluctuation–dissipation relation for giant magnetoresistive 1/f noise;Hardner;Phys. Rev. B,1993
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献