Characterisation of trapped electric charge carriers behaviour at nanometer scale by electrostatic force microscopy-Reference-Cited by-同舟云学术

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Characterisation of trapped electric charge carriers behaviour at nanometer scale by electrostatic force microscopy

Published:2008-09 Issue:9-10 Volume:66 Page:538-547
ISSN:0304-3886
Container-title:Journal of Electrostatics
language:en
Short-container-title:Journal of Electrostatics

Author:

Marchi F.,Dianoux R.,Smilde H.J.H.,Mur P.,Comin F.,Chevrier J.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Biotechnology,Electronic, Optical and Magnetic Materials

Reference42 articles.

1. Relationship between charge distribution and its image by electrostatic force microscopy

2. Mapping of mobile charges on insulator surfaces with the electrostatic force microscope

3. Two-dimensional dopant profiling by scanning capacitance force microscopy

4. Kelvin probe force microscopy

5. Charge storage in Co nanoclusters embedded in SiO2 by scanning force microscopy

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