High-precision calculation of quasistatic field near a photocathode surface microrelief-Reference-Cited by-同舟云学术

High-precision calculation of quasistatic field near a photocathode surface microrelief

Published:2007-11 Issue:12 Volume:65 Page:735-741
ISSN:0304-3886
Container-title:Journal of Electrostatics
language:en
Short-container-title:Journal of Electrostatics

Author:

Gorlov Timofey

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Biotechnology,Electronic, Optical and Magnetic Materials

Reference14 articles.

1. A.M. Tron, T. Gorlov, Photocathode roughness impact on photogun beam characteristics, in: Proceedings of EPAC, 2006, Edinburgh, Scotland, pp. 121–123.

2. M. Krasilnikov, Impact of the cathode roughness on the emittance of an electron beam, FEL 2006, Berlin, August 2006, pp. 583–586.

3. Effects of cathode roughness on the quality of electron beams;Lau;J. Appl. Phys.,1987

4. Influence of surface roughness on space charge limited emission;Nijkerka;Appl. Surf. Sci.,2004

5. Electrode roughness effects on the breakdown of air-insulated apparatus;Mandy;IEEE Trans. Dielectrics Electrical Insulation,1998

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