Comprehensive ESD protection approach in advanced CMOS SOI technologies-Reference-Cited by-同舟云学术

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Comprehensive ESD protection approach in advanced CMOS SOI technologies

Published:2006-10 Issue:11 Volume:64 Page:720-729
ISSN:0304-3886
Container-title:Journal of Electrostatics
language:en
Short-container-title:Journal of Electrostatics

Author:

Khazhinsky Michael G.,Stockinger Michael,Miller James W.,Weldon James C.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Biotechnology,Electronic, Optical and Magnetic Materials

Reference32 articles.

1. ESD design methodology;Merrill;EOS/ESD Symp. Proc.,1993

2. Core clamps for low voltage technologies;Dabral;EOS/ESD Symp. Proc.,1994

3. Sub-micron chip ESD protection schemes which avoid avalanching junctions;Worley;EOS/ESD Symp. Proc.,1995

4. Transient supply clamp with a variable RC time constant;Croft;EOS/ESD Symp. Proc.,1996

5. Cross-referenced ESD protection for power supplies;Anderson;EOS/ESD Symp. Proc.,1998

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. ESD protection design for I/O libraries in advanced CMOS technologies;Solid-State Electronics;2008-08

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