Objective Bayesian analysis for competing risks model with Wiener degradation phenomena and catastrophic failures
Author:
Publisher
Elsevier BV
Subject
Applied Mathematics,Modeling and Simulation
Reference42 articles.
1. Reliability modeling of multi-state degraded systems with multi-competing failures and random shocks;Li;IEEE Trans. Reliab.,2005
2. Using degradation measures to estimate a time-to-failure distribution;Lu;Technometrics,1993
3. On the linear degradation model with multiple failure modes;Haghighi;J. Appl. Stat.,2010
4. Objective bayesian analysis for accelerated degradation test based on wiener process models;Guan;Appl. Math. Model.,2016
5. H. z, bayesian degradation analysis with inverse gaussian process models under time-varying degradation rates;Peng;IEEE Trans. Reliab.,2017
Cited by 13 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. The Wiener Process with a Random Non-Monotone Hazard Rate-Based Drift;Mathematics;2024-08-23
2. Reliability analysis method of competitive failure processes considering the coupling effect of multiple shock processes and degradation process;Quality and Reliability Engineering International;2024-03-12
3. Objective Bayesian Estimation for the Differential Entropy Measure Under Generalized Half-Normal Distribution;Bulletin of the Malaysian Mathematical Sciences Society;2022-12-01
4. Reliability estimation of complex systems based on a Wiener process with random effects and D-vine copulas;Microelectronics Reliability;2022-11
5. Statistical Analysis for Competing Risks’ Model with Two Dependent Failure Modes from Marshall–Olkin Bivariate Gompertz Distribution;Computational Intelligence and Neuroscience;2022-05-28
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3