1. Principle and Application of Sampling Inspection, Beijing;Yuan,2002
2. An optimization design of sequential and sequential truncated inspection scheme for missile test;Sun;Tact. M. Techno.,2001
3. The design of truncated sequential test plans based on attributes data;McWilliams;Commun. Stat. Simul. C.,2004
4. Analysis of operating characteristic curves of Gamma–Poisson sampling plans;Vijayaraghavan;Am. J. Math. Manage. Sci.,2007
5. A procedure for selection of a Gamma–Poisson single sampling plan by attributes;Vijayaraghavan;J. Appl. Stat.,2008