Author:
Fantini F.,Borgarino M.,Dieci D.,Menozzi R.,Cattani L.
Reference163 articles.
1. Life tests and field results of GaAs FETs
2. Proceedings of the GaAs Reliability Workshop;Beaulieu,1996
3. High-reliability GaAs-AlGaAs HBTs by MBE with Be base doping and InGaAs emitter contacts
4. Proceedings of the 7th National Symposium on Reliability and Quality Control;Goldthwaite,1961