1. X-ray interactions; photoabsorption, scattering, transmission, and reflection at E = 50-30000 eV, Z = 1-92;Henke;At. Data Nucl. Data Tables,1993
2. situ ellipsometric study of optical properties of ultrathin films;Yamamoto;Appl. Opt.,1992
3. XUV optical constants of single-crystal GaAs and sputtered C , Si Cr3C2, Mo ,and W;Windt;Appl. Opt.,1991
4. Optical constants for thin films of Ti, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Hf, Ta, W, Re, Ir, Os, Pt, and Au from 24 A to 1216 A;Windt;Appl. Opt.,1988
5. Optical constants for thin films of C, diamond, Al, Si and CVD SiC from 24 A to 1216 A;Windt;Appl. Opt.,1988