Germanium thin films on silicon for detection of Near-Infrared light-Reference-Cited by-同舟云学术

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Germanium thin films on silicon for detection of Near-Infrared light

Published:2002 Issue: Volume: Page:327-367
ISSN:
Container-title:Handbook of Thin Films
language:
Short-container-title:

Author:

Masini G.,Colace L.,Assanto G.

Publisher

Elsevier

Reference170 articles.

1. Progress in the smart pixel technologies

2. Proceedings of the 48th IEEE Conference on Electronic Components and Technology;Gates,1998

3. Proceedings of the 49th IEEE Conference on Electronic Components and Technology;Delpiano,1999

4. Wafer bonding technology and its applications in optoelectronic devices and materials

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1. CMOS Photonics: A Platform for Optoelectronics Integration;Topics in Applied Physics;2010-09-30

2. The fabrication of p-Ge/n-Si photodetectors, compatible with back-end Si CMOS processing, by low temperature (< 400 °C) molecular beam epitaxy and electron-beam evaporation;MRS Proceedings;2003

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