Author:
Prokopiou Danae,Rogers Keith,Evans Paul,Godber Simon,Dicken Anthony
Reference22 articles.
1. Non-invasive analysis of turbid samples using deep Raman spectroscopy;Buckley;Analyst,2011
2. Chan, J., Evans, P., Wang, X., Godber, S., Peatfield, I., Rogers, K., Rogers, J., Dicken, A., 2010. Scatter enhanced 3D X-ray imaging for materials identification, Security Technology (ICCST). in: Proceedings of 2010 IEEE International Carnahan Conference. pp. 142–147.
3. Ultra-low-field MRI for the detection of liquid explosives;Espy;Supercond. Sci. Technol.,2010
4. Evans, P., Rogers, K., 2008. Detection of X-ray scattering, International Patent No.WO2008149078.
5. High intensity x-ray diffraction in transmission mode emloying an analog of Poisson's spot;Evans;Appl. Phys. Lett.,2010
Cited by
17 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献