X-ray diffraction residual stress calculation on textured La2/3Sr1/3MnO3 thin film
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference22 articles.
1. Intrinsic electrical transport and magnetic properties ofLa0.67Ca0.33MnO3andLa0.67Sr0.33MnO3MOCVD thin films and bulk material
2. Solid state magnetic field sensors and applications
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4. Preparation of epitaxial La1−xSrxMnO3 films on SrTiO3(001) by dipping-pyrolysis process
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