Characterization of grown-in dislocations in high-quality glucose isomerase crystals by synchrotron monochromatic-beam X-ray topography

Author:

Suzuki Ryo,Koizumi Haruhiko,Kojima Kenichi,Fukuyama Seijiro,Arai Yasutomo,Tsukamoto Katsuo,Suzuki Yoshihisa,Tachibana Masaru

Funder

Photon Factory Program Advisory Committee

KAKENHI

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics

Reference37 articles.

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2. High-Resolution X-Ray Diffractometry and Topography;Bowen,1998

3. Dynamical Theory of X-Ray Diffraction;Authier,2004

4. The Perfection of Protein Crystals Probed by Direct Recording of Bragg Reflection Profiles with a Quasi-Planar X-ray Wave;Fourme;J. Synchrotron Rad.,1995

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