A new set-up of Mössbauer Spectroscopic Microscope to study the correlation between Fe impurities and lattice defects in Si crystals-Reference-Cited by-同舟云学术

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A new set-up of Mössbauer Spectroscopic Microscope to study the correlation between Fe impurities and lattice defects in Si crystals

Published:2017-06 Issue: Volume:468 Page:489-492
ISSN:0022-0248
Container-title:Journal of Crystal Growth
language:en
Short-container-title:Journal of Crystal Growth

Author:

Ino Yuji,Watanabe Tomio,Hayakawa Kazuo,Yukihira Kenichi,Matsumuro Kazuaki,Fujita Hirotaka,Ogai Keiko,Moriguchi Koichi,Harada Yoshihito,Soejima Hiroyoshi,Yoshida Yutaka

Funder

Japan Science and Technology Agency

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics

Reference12 articles.

1. Transition-metal profiles in a multicrystalline silicon ingot

2. A fast, preparation‐free method to detect iron in silicon

3. Synchrotron-based investigations of the nature and impact of iron contamination in multicrystalline silicon solar cells

4. Defects and Impurities in Silicon Materials;Langouche,2015

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Mössbauer Spectroscopic Studies on Atomic Diffusion in Materials;Topics in Applied Physics;2021

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