In-situ control of molecular beam epitaxial growth by spectral reflectivity analysis-Reference-Cited by-同舟云学术

In-situ control of molecular beam epitaxial growth by spectral reflectivity analysis

Published:2021-03 Issue: Volume:557 Page:125993
ISSN:0022-0248
Container-title:Journal of Crystal Growth
language:en
Short-container-title:Journal of Crystal Growth

Author:

Biermann Klaus,Helgers Paul L.J.,Crespo-Poveda Antonio,Kuznetsov Alexander S.,Tahraoui Abbes,Röben Benjamin,Lü Xiang,Schrottke Lutz,Santos Paulo V.,Grahn Holger T.

Funder

European Regional Development Fund

Deutsche Forschungsgemeinschaft

Leibniz-Gemeinschaft

Horizon 2020

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics

Reference63 articles.

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4. Azimuthal reflection high-energy electron diffraction study of MnAs growth on GaAs(001) by molecular beam epitaxy;Satapathy;J. Appl. Phys.,2011

5. Microstructure of epitaxial MnAs films on GaAs(001): An in situ x-ray study;Jenichen;J. Appl. Phys.,2004

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