Characterization of high-quality kerfless epitaxial silicon for solar cells: Defect sources and impact on minority-carrier lifetime-Reference-Cited by-同舟云学术

Characterization of high-quality kerfless epitaxial silicon for solar cells: Defect sources and impact on minority-carrier lifetime

Author:

Kivambe Maulid M.,Powell Douglas M.,Castellanos Sergio,Jensen Mallory Ann,Morishige Ashley E.,Lai Barry,Hao Ruiying,Ravi T.S.,Buonassisi Tonio

Funder

U.S. Department of Energy

National Science Foundation

U.S. DOE

NSF CA

Department of Defense

National Defense Science and Engineering Graduate Fellowship Program

NSF

U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics

Reference69 articles.

1. ITRPV, International Technology Roadmap for Photovoltaic, seventh ed.: Results 2016, http://www.itrpv.net/Reports/Downloads/, 2017.

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