Piezoresistive failure behaviors and mechanisms of the ITO thin films at high temperatures-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Piezoresistive failure behaviors and mechanisms of the ITO thin films at high temperatures

Published:2023-09 Issue: Volume:215 Page:112254
ISSN:0042-207X
Container-title:Vacuum
language:en
Short-container-title:Vacuum

Author:

Liu Zhichun,Liang Junsheng^ORCID,Wang Biling,Hou Zhenqi,Wang Haigang^ORCID,Sun Hongyi,Lu Wenqi,Li Qiang,Zhao Xin,Xu Jun,Wang Dazhi

Funder

Aviation Science Fund

National Natural Science Foundation of China

National Key Research and Development Program of China

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference38 articles.

1. High temperature thermoelectric properties of nitrogen doped ITO thin films;Zhao;Vacuum,2020

2. Fabrication and characterization of nickel thin film as resistance temperature detector;Cui;Vacuum,2020

3. ITO film prepared by ion beam sputtering and its application in high-temperature thermocouple;Zhang;Vacuum,2017

4. Fabrication and characterization of ITO thin film resistance temperature detector;Wang;Vacuum,2017

5. The influence of spatial arrangement of endpoints on output characteristics of ITO/In2O3 heat flux gauge;Li;Sensor. Actuator.,2021

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP