Experimental frequency analysis of p and n-type semiconductor barriers in SBD system
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation
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Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Experimental Investigation of Semiconductor Barriers Exposed to Variable Strong Electric Field at Vacuum Conditions;Journal of Electronic Materials;2023-09-15
2. Experimental Analysis of Current Oscillations of Semiconductor Barrier Discharge;IEEE Transactions on Plasma Science;2020-11
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