Determination of spatial distribution of alloying and impurity elements in zircaloy using imaging secondary ion mass spectrometry and principal component analysis-Reference-Cited by-同舟云学术

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Determination of spatial distribution of alloying and impurity elements in zircaloy using imaging secondary ion mass spectrometry and principal component analysis

Published:2017-02 Issue: Volume:136 Page:1-9
ISSN:0042-207X
Container-title:Vacuum
language:en
Short-container-title:Vacuum

Author:

Karki V.,Agarwal R.,Alamelu D.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference31 articles.

1. Quantitative imaging of trace B in Si and SiO2 using ToF-SIMS;Smentkowski;J. Vac. Sci. Technol.,2015

2. Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications, and Trends;Benninghoven,1987

3. Secondary Ion Mass Spectrometry: a Practical Handbook for Depth Profiling and Bulk Impurity Analysis;Wilson,1989

4. Practical Surface Analysis: Ion and Neutral Spectroscopy;Briggs,1992

5. Depth distribution of Mn in Mn doped GaAs using secondary ion mass spectrometry;Karki;J. Vac. Sci. Technol.,2016

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Comparative research fluorine and colloidal aggregate formation on the surface lithium fluoride thin films during electronic, ionic and thermal treatments;Vacuum;2023-07

2. Homogeneous graphene oxide production with the variance reduction techniques: Taguchi method with the principal component analysis;Vibrational Spectroscopy;2019-09

3. Influence of the size of the prior β grains on the microstructure of β quenched Zircaloy-4;Metallurgical Research & Technology;2018-12-14

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