Author:
Srnanek R.,Vesely M.,Vincze A.,Florovic M.,Kovac J.,Irmer G.,Prunici P.,Mc Phail D.S.,Sciana B.,Radziewicz D.,Tlaczala M.
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation
Reference6 articles.
1. Raman spectroscopy—A versatile tool for characterization of thin films and heterostructures of GaAs and AlxGa1−xAs
2. Polarization and Intensity of Raman Scattering from Plasmons and Phonons in Gallium Arsenide
3. Diagnostics of Si multi-δ-doped GaAs layers by Raman spectroscopy on bevelled structures
4. Srnanek R, Lentze M, Geurts J, Kordos P, Förster A, Sciana B, et al. In: Proceedings of abstracts, Dresden, Germany, March 2003, p.205.
5. A computer controlled chemical bevel etching apparatus: applications to Auger analysis of multi-layered structures
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