Structural analysis of silicon nanostructures obtained from thermal annealing of PVD deposited SRO/SiO2 multilayers-Reference-Cited by-同舟云学术

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Structural analysis of silicon nanostructures obtained from thermal annealing of PVD deposited SRO/SiO2 multilayers

Published:2019-08 Issue: Volume:166 Page:32-36
ISSN:0042-207X
Container-title:Vacuum
language:en
Short-container-title:Vacuum

Author:

Prušáková L.,Šutta P.^ORCID,Medlín R.^ORCID,Vincze A.

Funder

European Regional Development FundEuropean Regional Development Fund (ERDF)

ERDF

CENTEM PLUS

Ministry of Education

National Sustainability Programme I

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference23 articles.

1. Silicon quantum dot nanostructures for tandem photovoltaic cells;Conibeer;Thin Solid Films,2008

2. Size-controlled highly luminescent silicon nanocrystals: a SiO/SiO2 superlattice approach;Zacharias;Appl. Phys. Lett.,2002

3. Assessment of the composition of Silicon-Rich Oxide films for photovoltaic applications by optical techniques;Morgano;Energy Procedia,2011

4. Electroluminescence of as-sputtered silicon-rich SiOx films;Zhang;Vacuum,2010

5. Progress with Silicon-Based Tandem Cells Using Silicon Quantum Dots in a Dielectric Matrix, 22nd EPSEC;Green,2007

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Ozone Initiated pH Dependent Oxidation of Cyclohexane Over Fe Supported SiO2 and γ-Al2O3 Catalysts;Topics in Catalysis;2022-12-28

2. A synergistic approach of interface engineering to improve the performance of silicon nanocrystal light-emitting diode;Vacuum;2022-03

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