High angle annular dark field-scanning transmission electron microscopy and high-resolution transmission electron microscopy studies in the Er2O3

High angle annular dark field-scanning transmission electron microscopy and high-resolution transmission electron microscopy studies in the Er2O3–ZrO2 system

Published:2010-05 Issue:10 Volume:84 Page:1226-1231
ISSN:0042-207X
Container-title:Vacuum
language:en
Short-container-title:Vacuum

Author:

Angeles-Chavez C.,Salas P.,Lopez-Luke T.,de la Rosa E.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

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1. Synthesis and Luminescent Properties of Nanocrystalline (1 – х)ZrO2–хEr2O3 (х = 0.015–0.5) Solid Solutions;Russian Journal of Inorganic Chemistry;2020-09

2. Crystalline and narrow band gap semiconductor BaZrO3: Bi–Si synthesized by microwave–hydrothermal synthesis;Catalysis Today;2015-07

3. Green upconversion emission dependence on size and surface residual contaminants in nanocrystalline ZrO2:Er3+;Journal of Sol-Gel Science and Technology;2012-05-31

4. Structure, ordering, and surfaces of Pt–Fe alloy catalytic nanoparticles from quantitative electron microscopy and X-ray diffraction;Nanoscale;2012

5. Atomic Layer Deposition and Characterization of Erbium Oxide-Doped Zirconium Oxide Thin Films;Journal of The Electrochemical Society;2010