How the sensitivity in PIXE elemental analysis is affected by the type of particle, cross-sections, background radiation and other factors?-Reference-Cited by-同舟云学术

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How the sensitivity in PIXE elemental analysis is affected by the type of particle, cross-sections, background radiation and other factors?

Published:2010-05 Issue:10 Volume:84 Page:1250-1253
ISSN:0042-207X
Container-title:Vacuum
language:en
Short-container-title:Vacuum

Author:

Romo-Kröger C.M.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference21 articles.

1. X-ray emission spectroscopy;Valkovic;Contemp Phys,1973

2. Particle induced X-ray emission spectroscopy (PIXE);Johansson,1995

3. Proton induced X-ray emission - a tool for non destructive trace element analysis;Govil;Curr Sci,2001

4. The status of the theoretical K-shell ionization cross sections by protons;Lapicki;X-Ray Spectrom,2005

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Angular distribution of characteristic X-ray emission from Fe and V following photoionization;Acta Physica Sinica;2020

2. On the angular dependence of L X-ray intensity ratios for Au following photoionization;Radiation Physics and Chemistry;2017-04

3. K-shell X-ray production cross sections of Ni induced by protons, alpha-particles, and He+;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-11

4. Development of a PIXE method at high energy with the ARRONAX cyclotron;Journal of Radioanalytical and Nuclear Chemistry;2014-07-19

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