Electron binding energy XPS control of n-GaAs with the atomically clean surface etched by Ar+ ions

Author:

Mikoushkin V.M.ORCID,Makarevskaya E.A.,Novikov D.A.,Marchenko D.E.

Funder

Russian Science Foundation

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference28 articles.

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3. Practical Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy,1983

4. Core-level spectra and binding energies of transition metal nitrides by non-destructive x-ray photoelectron spectroscopy through capping layers;Greczynski;Appl. Surf. Sci.,2017

5. Effects of ion beam bombardment on electrochromic tungsten oxide films studied by X-ray photoelectron spectroscopy and Rutherford back-scattering;Wong;Thin Solid Films,2000

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