Evaluation of a mobile vacuum transfer system for in vacuo XPS analysis using as-deposited Ti thin-films-Reference-Cited by-同舟云学术

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Evaluation of a mobile vacuum transfer system for in vacuo XPS analysis using as-deposited Ti thin-films

Published:2015-07 Issue: Volume:117 Page:81-84
ISSN:0042-207X
Container-title:Vacuum
language:en
Short-container-title:Vacuum

Author:

Vogel U.,Brachmann E.,Oswald S.,Menzel S.,Gemming T.,Eckert J.

Funder

Deutsche Forschungsgemeinschaft

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference17 articles.

1. Evaluation of a simple correction for the hydrocarbon contamination layer in quantitative surface analysis by XPS

2. Quantitative XPS surface analysis: Correction for contamination layer

3. Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids

4. Transfer of samples between separated ultrahigh vacuum instruments for semiconductor surface studies

5. High performance portable vacuum suitcase

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