Oxide-state evaluation of the zinc and aluminium in metallic thin films using Auger-electron-spectroscopy depth profiles-Reference-Cited by-同舟云学术

Oxide-state evaluation of the zinc and aluminium in metallic thin films using Auger-electron-spectroscopy depth profiles

Published:2013-12 Issue: Volume:98 Page:88-92
ISSN:0042-207X
Container-title:Vacuum
language:en
Short-container-title:Vacuum

Author:

Mandrino Djordje,Godec Matjaž,Nolan David

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference13 articles.

1. Lin F, Dai X, Li J, Yao Z, Wang N. Conference on electrical insulation and dielectric phenomena (CEIDP). Annual report 2, 2000, p. 592–5.

2. Polypyrrole film on 55% Al–Zn-coated steel for corrosion prevention

3. Godec M, Mandrino Dj, Gaberšček M. Investigation of performance degradation in metallized film capacitors. Thin Solid Films, submitted for publication.

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