Optical characterization of vacuum evaporated a-Se80Te20−xCux thin films-Reference-Cited by-同舟云学术

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Optical characterization of vacuum evaporated a-Se80Te20−xCux thin films

Published:2008-02 Issue:6 Volume:82 Page:608-612
ISSN:0042-207X
Container-title:Vacuum
language:en
Short-container-title:Vacuum

Author:

Ahmad Anis,Khan Shamshad A.,Sinha Kirti,Kumar Lokendra,Khan Zishan H.,Zulfequar M.,Husain M.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference28 articles.

1. Growth, structural and optical properties of non-stoichiometric CuIn(S1−xSex)2 thin films deposited by solution growth technique for photovoltaic application

2. Effect of Tl addition on the electrical properties of amorphous As20Se80−xTlx films

3. Structural and morphological characterization of chemically deposited silver films

4. An analytical model to represent crystallization kinetics in materials with metastable phase formation

5. A new DTA method for measuring critical cooling rate for glass formation

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1. Exploration of electrode-modulated memory and threshold switching behaviour in Se-Te-Sn thin film devices;Surfaces and Interfaces;2024-05

2. Optical red shift spectra in CuxGe32S68-x films for infrared and solar cell window applications;Surfaces and Interfaces;2024-01

3. Impact of iron doping on the structural and optical properties of nano Tin mono-sulfide SnS;Optical and Quantum Electronics;2023-11-23

4. Tailoring of optical properties of Se80Te20-xInx films by annealing process;Applied Physics A;2022-07-06

5. Intensive linear and nonlinear optical studies of thermally evaporated amorphous thin Cu-Ge-Se-Te films;Journal of Non-Crystalline Solids;2022-06

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