Low temperature-high pressure grown thin gate dielectrics for MOS applications-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Low temperature-high pressure grown thin gate dielectrics for MOS applications

Published:1999-09 Issue:1-4 Volume:48 Page:223-226
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Ramgopal Rao V.,Hansch W.,Mahapatra S.,Sharma D.K.,Vasi J.,Grabolla T.,Eisele I.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference14 articles.

1. High-quality MOSFETs with ultrathin LPCVD gate SiO/sub 2/

2. Rapid Thermal Annealed Low Pressure Chemical‐Vapor‐Deposited SiO2 as Gate Dielectric in Silicon MOSFET's

3. Electrical characteristics of MOSFETs using low-pressure chemical-vapor-deposited oxide

4. Electrical characteristics of very thin SiO2deposited at low substrate temperatures

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP