Equivalent modeling techniques for predicting pattern transfer in EPL masks

Author:

Cotte E.P.,Lovell E.G.,Engelstad R.L.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference6 articles.

1. Prediction of in-plane distortions due to mask fabrication processes;Laudon;Microelectron. Eng.,1997

2. Pattern placement errors in mask membranes;Fisher;J Vac. Sci. Technol. B,1997

3. Pattern Transfer on Mask Membranes;Fisher;J Vac. Sci. Technol. B,1998

4. A. Fisher, Analysis and Simulation of Pattern Placement Errors in Advanced Lithographic Masks, Ph.D. Thesis, Department of Mechanical Engineering, University of Wisconsin, 1998.

5. E. Cotte, R. Engelstad, E. Lovell, C. Brooks, Predicting Mechanical Distortions in X-ray Masks, Proceedings of the 1999 SPIE Symposium on Emerging Lithographic Technologies III, 3676 (1999) 429–440.

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Predicting mask distortion, clogging and pattern transfer for stencil lithography;Microelectronic Engineering;2007-01

2. Bibliography (1994–2004) of other topics;Modelling and Simulation in Materials Science and Engineering;2004-12-08

3. Predicting image placement accuracy of x-ray masks;SPIE Proceedings;2004-05-20

4. Predicting critical dimension uniformity in advanced electron-beam projection lithography masks;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;2003

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