Author:
Maes H.E.,Groeseneken G.,Degraeve R.,De Blauwe J.,Van den bosch G.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference72 articles.
1. Physics of semiconductor devices;Sze,1981
2. The future of ultra-small-geometry MOSFETs beyond 0.1 micron
3. The SiSiO2 system;Balk,1988
4. The SiSiO2 system;Helms,1988
5. The SiSiO2 system;Svensson,1988
Cited by
7 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. References;Reliability Prediction for Microelectronics;2024-02-16
2. PHYSICS OF FAILURES;Reliability Engineering;2020-11-13
3. Electron Trap Energy Distribution in HfO
2
by the Discharge-Based Pulse
I–V
Technique;Chinese Physics Letters;2014-12
4. Bibliography;Reliability Prediction from Burn-In Data Fit to Reliability Models;2014
5. Electronic circuit reliability modeling;Microelectronics Reliability;2006-12