Author:
Leonardi K,Ohkawa K,Hommel D,Selke H,Gindele F,Woggon U
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
1 articles.
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1. Surface Evaluation by Atomic Force Microscopy;Encyclopedia of Materials: Science and Technology;2001