Contactless mapping of mesoscopic resistivity variations in semi-insulating substrates-Reference-Cited by-同舟云学术

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Contactless mapping of mesoscopic resistivity variations in semi-insulating substrates

Published:1999-12 Issue:1-3 Volume:66 Page:21-25
ISSN:0921-5107
Container-title:Materials Science and Engineering: B
language:en
Short-container-title:Materials Science and Engineering: B

Author:

Stibal R,Wickert M,Hiesinger P,Jantz W

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference9 articles.

1. Contactless evaluation of semi-insulating GaAs wafer resistivity using the time-dependent charge measurement

2. Proceedings of the SIMC VII, Ixtapa 1992, IOP, Bristol;Jantz,1993

3. Proceedings of EXMATEC 96, Freiburg;Young;Mat. Sci. Eng.,1997

4. Proceedings of EXMATEC 96, Freiburg;Miner;Mat. Sci. Eng.,1997

5. Standard Test Method DIN 50448,1998

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1. Characterization of photon counting pixel detectors based on semi-insulating GaAs sensor material;Journal of Physics: Conference Series;2013-03-22

2. Inclusions Elimination and Resistivity Restoration of CdTe:Cl Crystals by Two-Step Annealing;IEEE Transactions on Nuclear Science;2011-08

3. Kinetics study on the mechanism of zero-bias photocurrent in semi-insulating bulk GaAs;Materials Science and Engineering: B;2003-04

4. Nondestructive topographic resistivity evaluation of semi‐insulating SiC substrates;physica status solidi (c);2003-02

5. Quantitative topographic assessment of Cu incorporation in GaAs;Journal of Crystal Growth;2000-03

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