Defect reaction and its application to silicon materials technology-Reference-Cited by-同舟云学术

Defect reaction and its application to silicon materials technology

Published:2000-03 Issue:2-3 Volume:72 Page:67-72
ISSN:0921-5107
Container-title:Materials Science and Engineering: B
language:en
Short-container-title:Materials Science and Engineering: B

Author:

Sumino Koji

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference21 articles.

1. K. Sumino, in: S. Mahajan, J.W. Corbett (Eds.) Defects in Semiconductors II, MRS Symposia Proceedings, vol. 14, North-Holland, New York, 1983, pp. 307.

2. Point and Extended Defects in Semiconductors;Sumino,1989

3. Current Problems of Defects in Semiconductors – Interaction of Defects with Impurities

4. In situ X-raytopographic studies of the generation and the multiplication processes of dislocations in silicon crystals at elevated temperatures

5. Oxygen in silicon;Sumino,1994

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