Author:
Bouzidi A.,Boudissa A.,Benamara Z.,Anani M.,Sehil H.,Akkal B.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference7 articles.
1. An investigation of surface state at silicon/silicon oxide interface employing metal—oxide—silicon diodes;Terman;Solid State Electron.,1962
2. Etude des différentes méthodes de caractérisation d'une structure MOS;Chellali;Thèse de Magister de microélectronique de l'université de Sidi Bel Abbès,1993
3. Physics of Semiconductor Devices;Sze,1981
4. Physique des semiconducteurs et des composants électroniques;Mathieu,1990
5. Preparation and ESCA analysis of the germanium surface; electrical characterization of the Al2O3/Ge and Al2O3/Ge;Benamara;Mater. Chem. Phys.,1994
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献