Real defect concentration measurements of nuclear detector materials by the combination of PICTS and SCLC methods

Author:

Ayoub M,Hage-Ali M,Koebel J.M,Regal R,Rit C,Klotz F,Zumbiehli A,Siffert P

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Cited by 18 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Space-Charge-Limited Photocurrents and Transient Currents in (Cd,Zn)Te Radiation Detectors;Physical Review Applied;2020-06-22

2. On the influence of dislocation walls in CdTe:Cl;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2016-03

3. Investigation of structural defects in In-doped CdZnTe under different in-situ annealing cooling rates;Journal of Crystal Growth;2015-09

4. Polarization phenomena in Al/p-CdTe/Pt X-ray detectors;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2013-12

5. Study of the effect of the stress on CdTe nuclear detectors;Journal of Applied Physics;2013-09-14

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