Variation and defect tolerance for diode-based nano crossbars

Author:

Tahoori M.B.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Applied Mathematics,Computer Networks and Communications

Reference30 articles.

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3. H. Iwai, Cmos scaling toward sub-10 nm regime, in: IEEE Int’l Symp. on Electron Devices for Microwave and Optoelectronic Applications, EDMO, Nov. 2003, pp. 30–34.

4. Carbon Nanotube-based nonvolatile random access memory for molecular computing;Rueckes;Science,2000

5. Functional nanoscale electronic devices assembled using silicon nanowire building blocks;Cui;Science,2001

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